Surface-Spectroscopy and Microscopy
XPS (X-Ray Photoelectron Spectroscopy) UPS (Ultraviolet Photoelectron Spectroscopy) AES (Auger Electron Spectroscopy) ISS (Ion Scattering Spectroscopy) Depth profiling (ARXPS, sputtering)
Microscopy
SEM (Scanning Electron Microscopy) SAM (Scanning Auger Microscopy) STM (Scanning Tunneling Microscopy)
Preparation
PVD (Physical Vapor Deposition) CVD (Chemical Vapor Deposition) Low Energy Electron Irradiation Sample heating/cooling Sputtering
Whiteroom (Class 1000)
Wetbench Optical Microscopes Spin Coater Photolithography
Greyroom
Optical Microscopes Critical Point Dryer Ozone Cleaner Contact Angle Measurement System
Helium Ion Microscope Orion from Zeiss ELPHY MultiBeam Pattern Generator from Raith https://raith.com/product/elphy/
Low Energy Electron Point Source (LEEPS) microscope Nanomanipulator Single nanowire experiments
Low Energy Electron Point Source (LEEPS) microscope High resolution detector Electron Holography
AFM (Atomic Force Microscopy) STM (Scanning Tunneling Microscopy) Electrochemistry
IRRAS (Infrared Reflection Absorption Spectroscopy) ATR-IR (Attenuated Total Reflection Spectroscopy)
Low Energy Electron Irradiation